Beijing, China, November 10, 2025 — On November 10, Bai Qingyuan, Vice Minister of the State Administration for Market Regulation (SAMR), met in Beijing with a visiting delegation led by Dr. Wynand Louw, President of the International Committee for Weights and Measures (CIPM). The delegation also included Mr. Henry Rotich, President of the Intra-Africa Metrology System (AFRIMETS) and Deputy Director of the Kenya Bureau of Standards (KEBS), and Dr. Abdellah Ziti, Director of the Public Testing and Research Laboratory of the Moroccan Metrology Institute, among others.

The two sides exchanged views on deepening China’s participation in the work of international metrology organizations and expanding China–Africa cooperation in the field of metrology. Dr. Li Wentao, President of the National Institute of Metrology, China (NIM), attended the meeting.

Following the meeting, Dr. Louw and his three colleagues, together with Professor Andrew Buffler from the Department of Physics at the University of Cape Town and Professor Stephan Reichelt, Director of the Institute of Applied Optics at the University of Stuttgart, visited NIM for discussions and a tour.

Dr. Qu Jifeng, Vice President of NIM, met with the delegation. Heads of relevant departments and key researchers from NIM also took part in the exchange. Dr. Qu expressed appreciation to Dr. Louw and other international partners for their long‑standing support for NIM’s development. He stated that NIM will continue to actively participate in the work of international organizations, promote the implementation of international metrology strategies, and deepen bi‑ and multilateral metrology exchanges and cooperation with South Africa, Kenya, and other countries, in order to support the implementation of the outcomes of the Forum on China–Africa Cooperation (FOCAC).

Dr. Louw and other members of the delegation highly commended NIM’s achievements in the field of metrology and its important contributions to the development of international metrology. They expressed the hope that NIM will continue to support international metrology activities and help advance practical results in China–Africa metrology cooperation.

During the discussions, all parties introduced the mandates and recent work of their respective institutions. Through in‑depth exchanges, they reached preliminary consensus on a number of issues, including the renewal of the Memorandum of Understanding on metrology cooperation between NIM and the Kenya Bureau of Standards, and the strengthening of scientific and technological collaboration in areas of common interest such as ionizing radiation metrology.

After the talks, Dr. Louw and his delegation visited several key laboratories at NIM, gaining a closer understanding of China’s latest progress in metrology science and technology.